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研究生: 茅雅音也
Ya-chih Mao
論文名稱: 先進電離層探測儀之機構設計與分析
Mechanical Design and Structure Analysis of Advanced Ionospheric Probe
指導教授: 趙吉光
口試委員:
學位類別: 碩士
Master
系所名稱: 地球科學學院 - 太空科學研究所
Graduate Institute of Space Science
論文出版年: 2013
畢業學年度: 101
語文別: 中文
論文頁數: 73
中文關鍵詞: 電離層探測儀科學酬載
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  • 安置在福爾摩沙衛星五號的科學酬載「先進電離層探測儀」(Advanced Ionospheric Probe, AIP),乃綜合多項電離層特性量測模組於一身。本文將呈現AIP的機構設計,並以分析方式來驗證下列各項需求。由於科學酬載的安裝位置已定,僅能以腳架支撐探測儀,以達到大於等於 50° x 50°的量測視野。此外,AIP的結構設計必須符合福衛五號對於科學酬載的介面需求,包括結構介面、熱介面、太空環境影響(例如氧原子侵蝕等影響)等。在結構方面,採用SolidWorks機械工程軟體輔助設計與模擬,估算一般測量參數:質量、質心、尺寸;靜態分析:負載因子、安全裕度、挫屈安全裕度、自然頻率;動態分析:弦波振動之位移量、速度與加速度。在熱分析方面,採用MSC/SINDA熱模擬分析軟體,配合福衛五號的環境熱模型,來評估AIP探測儀的溫度變化範圍、與衛星頂板的熱耦合效應。在氧原子侵蝕方面,列出AIP探測儀曝露於氧原子環境的材料,並參照材料與氧原子反應速率,估算氧原子對於結構的侵蝕程度是否會迅速降低電絕緣效果。結果顯示,AIP的結構設計與數值分析結果均能符合福衛五號的規範。


    Advanced Ionospheric Probe (AIP) is an all-in-one plasma sensor for the FORMOSAT-5 satellite to measure ionospheric plasma characteristics. Although a mounting space on the top panel is limited, a field of view (FOV) higher than 50° x 50° is required for the AIP to measure incoming ionic angles of arrival in most of orbital environment. Meanwhile, a mechanical design of the AIP shall meet all requirements of the FORMOSAT-5 satellite. In this report, the design of the AIP will be outlined and indicates that the FOV of the sensor can be achieved. The design is also verified by Dassault Systèmes SolidWorks Simulation 2011 in a static analysis, like mass, center of gravity, dimension, load factors, margin of safety, buckling safety margin, 1st mode natural frequency, and, in a dynamic analysis, like displacement, velocity, and acceleration of sine vibration. We carry out AIP thermal analysis with the satellite thermal model by use MSC/SINDA, give a range of the temperature. And the last one is the atomic oxygen analysis, which could sift material to follow the requirement.

    中文摘要 I ABSTRACT II 誌謝 III 目錄 IV 圖目錄 VI 表目錄 VIII 第一章 緒論 1 1.1 福爾摩沙衛星五號 1 1.2 先進電離層探測儀 1 1.3 平面式電漿探針 4 1.4 離子流向儀 6 1.5 離子捕獲儀 7 1.6 阻滯電位分析儀 7 1.7 測量需求 9 第二章 結構設計 11 2.1 基本規格 11 2.2 視場 12 2.3 篩網結構 14 2.4 材料選用限制 16 2.5 坐標系統 17 第三章 探測儀機械結構之強度分析 18 3.1 衛星工程之限制條件 18 3.2 靜態分析 19 3.3 動態分析 21 3.4 熱分析 21 3.5 氧原子侵蝕分析 22 3.6 模擬方法 22 第四章 結果及討論 32 4.1 電漿注入測試 32 4.2 靜態分析 33 4.3 動態分析 38 4.4 熱分析 40 4.5 氧原子侵蝕分析 51 第五章 結論與未來展望 52 參考文獻 54 附錄一 探測儀材料列表 57 附錄二 探測儀工程圖 (PROTOTYPE) 58 附錄三 探測儀質心位置圖 (PROTOTYPE) 60

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