本研究使用光激發螢光影像技術，建立圖像演算以及連結微觀載子行為至宏觀電性行為，也成功以晶圓螢光影像達到太陽能電池效率之預測。原始晶圓螢光影像經過圖像演算法後其螢光影像與濕清洗螢光影像之SSIM值從0.5461提升至0.6205。最終本研究針對357片晶圓影像作效率預測，與實際製成太陽能電池所量測效率之對應相關係數也高達0.6762。

The article utilizes photoluminescence(PL) imaging technology and successfully links macroscopic and microscopic phenomena. Solar cell efficiency prediction in as-cut wafer process with the help of photoluminescence is obtained. The SSIM values of as-cut wafer PL image and after calculated to wet-clean PL image raise from 0.5461 to 0.6205. 357 pieces solar cell procedure are utilized to confirm the method in this article. Correlation of predicted efficiency in as-cut wafer process and real efficiency in solar cell process is 0.6762.

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