| 研究生: |
呂恩澤 En-ze Lu |
|---|---|
| 論文名稱: |
群組資料指數分配型一逐步設限加速壽命試驗之最佳化設計 Optimal Design in Two-Step-Stress Accelerated Life Tests with Progressively type-I Censored Data |
| 指導教授: |
樊采虹
Tsai-Hung Fan |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
理學院 - 統計研究所 Graduate Institute of Statistics |
| 畢業學年度: | 98 |
| 語文別: | 中文 |
| 論文頁數: | 69 |
| 中文關鍵詞: | 群組資料 、逐步設限 、加速壽命試驗 、最佳化設計 、型一設限 |
| 外文關鍵詞: | Accelarate life test, step-stress accelarate life test, censoring scheme, grouped data, type-I censoring, Bayesian optimal design |
| 相關次數: | 點閱:12 下載:0 |
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加速壽命試驗是一種快速測量物件壽命的方法。本文考慮單一應力下兩階段的型一逐步設限加速壽命試驗, 在群組資料下假設物件壽命分配為指數分配, 且物件壽命和應力水準有線性與對數線性兩種模型之下, 分別在V-準則、D-準則和A-準則下決定最佳化試驗時間。在貝氏最佳化試驗中, 我們建議決定先驗分布的方法, 並比較其與傳統方法之差異。研究結果顯示, 若我們對參數有充份的訊息, 則貝氏最佳化設計較傳統方法好。
Accelerated life test (ALT) is a quickly method for estimating the life of item in reliability. Optimal design on the experimental time is an important issue on the ALT. In this thesis, we consider a two-step-stress accelerated life test under progressively Type-I censoring scheme, and
assume that the lifetime of each item follows an exponential distribution with grouped data. Determinations of the optimal experimental time based on V-optimality, D-optiamlity and A-optimality criteria with the mean life time of the experiment item being a linear and loglinear function of the stress variable are disscussed, respectively. We also study the corresponding Bayesian designs, and provide a way to select the prior distribution compared with the traditional methods. Empirical studies indicate that if we have more information from the parameters, we can do beter than the
traditional design.
[1] Atkinson, A. C. and Cook, R. D. (1995). “D-optimum designs for heteroscedastic linear mod-
els.” Journal of the American Statistical Association, 90, 204-212.
[2] Bai, D.S., and Kim, M.S. (1993). “Optimum simple step-stress accelerated life tests for weibull
distribution and type I censoring.” Naval Research Logistics, 40, 193-210.
[3] Bai, D.S., Kim, M.S. and Lee, S.H. (1989). “Optimum simple step-stress accelerated life tests
with censoring.” IEEE Transactions on Reliability, 38, 528-532.
[4] Balakrishnan, N. and Aggarwala,R. (2000). Progressive Censoring: Theory, Method, and
Applications. Birkhauser, Boston.
[5] Chalonerk, K. and Larntzk, K. (1992). “Bayesian design for accelerated life testing.” Journal
of Statistical Planning and Inference, 33, 245-259.
[6] Cohen, A.C. (1963). “Progressively censored samples in life testing.” Technometries, 5, 327-
329.
[7] Degroot, M. H. and Goel, P. K. (1979). “Bayesian estimation and optimal design in partially
accelerated life testing.” Naval Research Logistics Quart, 26, 223-235.
[8] Degroot, M. H. and Goel, P. K. (1988). Bayesian design and analysis of accelerated life testing
with step stress. In Accelerated Life Testing and Experts’ Opinions in Reliability (C. A.
Clarotti and D. V. Lindley, eds.) 193-202. North-Holland, Amsteram.
[9] Fan T.H., Wang W.L. and Balakrishnan, N. (2008). “Exponential progressive step-stress life-
testing with link function based on Box-Cox transformation.” Journal of Statistical Planning
and Inference, 138, 2340-2354.
[10] Gouno, E., Sen, A. and Balakrishnan, N. (2004). “Optimal step-stress test under progressive
Type-I censoring.” IEEE Transactions on Reliability, 53, 383-393.
[11] Khamis, I.H. (1997). “Optimum M-step, step-stress test with k stress variables.” Communications
in Statistics - Simulation and Computation, 26, 1301-1313.
[12] Khamis, I.H. and Higgins, J.J. (1998). “A new model for step-stress testing.” IEEE Transactions
on Reliability, 47, 131-134.
[13] Miller, R. and Nelson, W. (1983). “Optimum simple step stress plans for accelerated life
testing.” IEEE Transactions on Reliability, 32, 59-65.
[14] Naylor, J. D. H. (1994). Optimal design for accelerated life tests with restricted resources
. Ph.D. dissertation, School of Statistics, Univ. Minnesota.
[15] Nelson,W. (1980). “Accelerated life testing - step-stress models and data analysis.” IEEE
Transactions on Reliability, 29, 103-108.
[16] Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analyses
. John Wiley & Sons, New York.
[17] Tang, L.C., Sun, Y.S., Goh, T.N. and Ong, H.L. (1996). “Analysis of step-stress accelerated-
life-test data: a new approach.” IEEE Transactions on Reliability, 51, 69-74.
[18] Tang, L.C., Sun, Y.S., Goh, T.N. and Ong, H.L. (1999). “Planning accelerated life tests for
censored two-parameter exponential distributions.” Naval Research Logistics, 16, 169-18.
[19] Verdinelli, I., Polson, N. and Singpurwalla, N. (1993). Shannon information and Bayesian
design for prediction in accelerated life testing. In Reliability and Decision Making(R. E.
Barlow, C. A. Clarotti and F. Spizzichino, eds.) 247-256. Chapman and Hall, London.
[20] Wu, S.J., Lin, Y.P. and Chen, Y.J. (2006). “Planning step-stress life test with progressively
type I group-censored exponential data.” Neerlandica, 60, 46-56.
[21] Xiong, C. and Ji, M. (2004). “Analysis of grouped and censored data from stepstress life
test.” IEEE Transactions on Reliability, 53, 22-28.
[22] 吳秉懌. (2008). ”群組資料指數分配加速壽命試驗之貝氏可靠度分析與最佳化設計.” 國立中
央大學統計研究所碩士論文.
[23] 林章權. (2008). ”逐步加速壽命試驗之貝氏可靠度分析與最佳化設計.” 國立中央大學統計研
究所碩士論文.