| 研究生: |
林上偉 Shang-Wei Lin |
|---|---|
| 論文名稱: |
應用於單電子電晶體之矽/鍺量子點研製 Study of Forming Si/Ge Quantum dots for Single-Electron Devices |
| 指導教授: |
李佩雯
Pei-Wen Li |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
資訊電機學院 - 電機工程學系 Department of Electrical Engineering |
| 畢業學年度: | 92 |
| 語文別: | 中文 |
| 論文頁數: | 89 |
| 中文關鍵詞: | 小線寬間隙壁自我對準技術 、庫倫震盪效應 、庫倫阻斷效應 、矽鍺 、量子點 、單電子電晶體 |
| 外文關鍵詞: | Single-Electron Transistor(SET), Quantum dot, Coulomb blockade Effect, Narrow spacer self-alignment(NSSA)), Coulomb Oscillation Effcet |
| 相關次數: | 點閱:19 下載:0 |
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本論文之研究重點,在於發展可應用於矽基材單電子電晶體之量子點(線)的研製。有鑑於其他相關研究單位所發展的量子點製程,大都未考量製程中的穩定性、再現性、成本考量以及與現今半導體製程的相容性;故本論文將重點放在可相容於目前傳統的LSI製程,以及盡量提高製程的穩定性與再現性,並且降低製程的成本,發展出數種在傳統矽基材下可行的量子點(線)製作方式。
In this thesis, the technique of forming Si & Ge quantum dots for Single-electron devices will be proposed. The advantages of the technique are well controllable, reproducible and compatible with traditional CMOS process.
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