在本論文中，我們利用雙空間頻率光柵之剪影干涉儀以及光折變晶體剪影干涉儀獲得待測透鏡在兩垂直方向上不同的橫向剪影干涉圖形，再利用Zernike 多項式擬合求出像差係數並推算出待測波前的像差。我們進一步推算該透鏡的調制傳遞函數（MTF）；最後我們並利用正弦光柵片來量測MTF，並與上述計算比較。
在論文中，我們在全像片上記錄了在正交方面上各兩組光柵，該兩組光柵的空間頻率有些微的差距，可使兩繞射光在空間上產生橫向偏離，因此可利用該全像片產生正交方向的兩組橫向剪影干涉圖；我們也利用了光折變晶體當作儲存的資料庫，記錄了兩組光柵，也利用其繞射光產生橫向位移，形成橫向剪影干涉圖再以數位化技術分析干涉圖形，以獲得條紋中心位置與條紋階數(Fringe order)以供Zernike多項式擬合。
由於橫向剪影干涉圖形之分析所得的結果，只是待測波前的斜率，我們選擇以平均演算法來求得待測透鏡之波像差係數。我們利用所測得之波像差係數來計算MTF，同時在實驗上，我們利用該透鏡對正弦光柵片之成像來量測MTF，並與上述計算所得之MTF比較。
最後，我們將建立一套兼具像差與MTF之量測與推算的機制與系統。

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