福衛五號先進電離層探測儀（Advanced Ionosperic Probe, AIP）需要一套整合測試系統，驗證其中電漿探測器的量測特性，找出誤差範圍與校正曲線。此系統使用的硬體為NI-cRIO 9074搭配自製的三種C型模組，分別為收發模組(Transceiver Module)、SPI模組（皆為單端與差分訊號轉換），電源模組（電源監控與配置）。使用的軟體為LabVIEW FPGA Module與LabVIEW Real-Time Module。透過LabVIEW FPGA Module，撰寫類比轉數位元件(ADC-LTC1867)、數位轉類比元件(DAC-DAC121S101QCMK)、溫度感測器(TMP-TMP122AMDBVTEP)的SPI數位波形與其他數位IO的控制。透過LabVIEW Real-Time Module，撰寫指令收發與科學資料處理之功能。利用此測試系統，本論文已量測出探測器的掃描電壓校正曲線、電流注入校正曲線等重要特性，未來福衛五號進行科學量測時，將可依此正確地解釋量測的電離層參數。

Since the production of flight model of Advanced Ionospheric Probe (AIP) of FORMOSAT-5 (FS-5) has been completed. A test system is required to measure the characteristics of the sensor. The integrated test system is an overall solution for the controll, test and calibration for AIP. The main purpose is to measure the characteristics of sensor, finding the error range and the calibration curve. The hardware contains a controller of NI-cRIO 9074 and three self-made C series modules: transceiver module, SPI module and power module. Transceiver module and SPI module convert the single-ended signal to differential signal or in reverse. Power module distributes power to all devices and continuesly monitoring the current comsuption. The software is built with the embedded framework combined with LabVIEW FPGA module and LabVIEW Real-Time OS, which is based on the LabVIEW programming language. The LabVIEW FPGA module is used to achieve the SPI interfacing for ADC of LTC1867, DAC of DAC121S101, TMP of TMP122 and also some low-level IO control. The LabVIEW Real-Time OS is used to build the top-level UI consisted of command transmitter, science data viewer, and the preview on the result of data characteristics in real-time. This system is able to perform the current injection test to get the profile of calibration curves of AIP sensor, and also with the complete function of SPEU to perform the plasma injection test inside plasma chamber. With the integrated test system, a series of comprehensive test are done to get the parameters and characterestics curves of sensor, to ensure the accuracy and quality of geophysical data from AIP onboarded FS-5.

Chao, C. K. (2012), FORMOSAT-5 AIP System Specification, FS5SPL-CDRL-1005, NSPO/NARL.
Chao, C. K. (2012), FORMOSAT-5 AIP Interface Control Document, FS5SPL-CDRL-1009, NSPO/NARL.
Jhou, Y. H. and C. K. Chao (2013), FORMOSAT-5 AIP ISD to Spacecraft Bus Interface Test Report, FS5SPL-CDRL-1013, NSPO/NARL.
周彥含 (2013)，先進電離層探測儀地面電子測試測設備，碩士論文，國立中央大學。
陳冠文 (2013)，先進電離層探測儀離子流向推導與校正，碩士論文，國立中央大學。
茅雅音也 (2013)，先進電離層探測儀之機構設計與分析，碩士論文，國立中央大學。
林再文 (2014/06/16)，AIP DAC calibration and ADC Anti-aliasing Filter，Group Meeting。
林再文 (2014/04/09)，Cable for SU，Group Meeting。
林再文 (2014/02/10)，AIP/PLP Glitch，Group Meeting。
林再文 (2013/01/13)，SU Command and SOH；SPL IC List，Group Meeting。
林再文 (2013/10/07)，AIP Sensor Circuit Design Consideration，Group Meeting。
林再文 (2013/09/09)，Time Delay in SPI Bus AIP，Group Meeting。
林再文 (2013)，AIP Sensor Control Handout。
Visual Signal技術專欄 (2011)，從連續到數位。
NI-Tutorial-6983 (2012)，FPGA基本概念。
NI-Tutorial-3016 (2013)，類比取樣的基礎觀念。
NI Manual (2011), CompactRIO cRIO-9075/9076 Operating Instructions and Specifications.
NI Manual (2014), CompactRIO cRIO-9074XT Operating Instructions and Specifications.
NI Manual (2011), NI-845x Hardware and Software Manual.
NI Datasheet (2012), 24- Bit, 204.8KS/s Dynamic Signal Acquistion and Generation NI 4461, NI 4462.
KEITHLEY User’s Manual (2005), Model 6220 DC Current Source & Model 6221 AC and DC Current Source.
Angilent User’s Manual (2012)，Angilent 3350B系列波形產生器產品規格書。
Texus Instruments AN-903 (1993), A Comparison of Differential Termination Techniques.
Peter Avitabile (2001), Mechanical Engineering, Basics of Spectrum Analysis/Measurements and the FFT Analyzer, University of Massachusetts Lowell.
AN699 (1999), Anti-Aliasing, Analog Filter for Data Acquisition System.
吳家琪 (2012)，頻譜分析儀，國立台灣海洋大學。