| 研究生: |
吳明頤 Ming-I Wu |
|---|---|
| 論文名稱: |
調制傳遞函數量測儀器製作之研究 The Study of Making an MTF Measuring Instrument |
| 指導教授: |
王迺愨
Na-Ture Wang |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
理學院 - 光電科學與工程學系 Department of Optics and Photonics |
| 畢業學年度: | 89 |
| 語文別: | 中文 |
| 論文頁數: | 43 |
| 中文關鍵詞: | 調制傳遞函數 、直接掃描法 |
| 外文關鍵詞: | MTF, Modulation Transfer Function |
| 相關次數: | 點閱:10 下載:0 |
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實際製作部份,分別針對光源驅動、光網、影像旋轉裝置、單狹縫製作、馬達轉速、偵檢器頻寬等參數的影響做深入的探討,並依討論要點實際製作出量測儀器,量測出透鏡的MTF值。
In practice, the apparatus is made in consideration for the light source, grating type, image rotating mirror, single slit, motor rotating speed and the bandwidth of the amplifier. After adjusting properly, this apparatus can measure the MTF of a lens.
E. Hecht, Optics, 3rd ed. p.2-3, Addison-Wesley, New York, 1998
B. K. Johnson, Optics and Optical Instruments, pp.60-61, Dover, New York, 1960
(No author), Mil-Std-150A, Section 5.1.2.12, United State Air Force, 1959
呂乃光¸ 傅立葉光學, p.108, 機械工業, 北京, 中國
P. Elias, D. S. Grey, D. Z. Robinson, “Fourier Treatment of Optical Processes,” J. Opt. Soc. Am. 42, 127 (1952)
K. J. Rosenbruch, “The Meaning of the Phase Transfer Function and the Modular Transfer Function in Using OTF as a Criterion for Image Quality,” Optik 38, 178(In German) (1980),
C. S. Williams and O. A. Becklund, Introduction to the Optical Transfer Function, p.207, Wiley, New York, 1988
(No author), How to Measure MTF and other Properties of Lenses, Optikos Corporation, Cambridge, MA 1999
D. C. O’Shea, Element of Modern Optical Design, pp.226, John Wiley & Sons, New York, 1985
C. S. Williams and O. A. Becklund, Introduction to the Optical Transfer Function, p.248, Wiley, New York, 1988
F. Abbott, “Practical Aspects of Transfer Function Measurement,” in Modulation Transfer Function SPIE Seminar Proceedings, Vol.13, S.P.I.E., 1969
C. S. Williams and O. A. Becklund, Introduction to the Optical Transfer Function, p.258, Wiley, New York, 1988
W. J. Smith, Modern Optical Engineering, 2nd Ed. pp.103, McGraw-Hill, New York, 1990
K. R. Barnes, The Optical Transfer Function, pp.20, American Elsevier, New York, 1971
(No author), Edmund Industrial Optics, 2000 Optics and Optical Instruments Catalog, pp.13, Edmund Industrial, Barrington, NJ.