許多文獻常以韋伯可靠度退化模式來描述整個可靠度隨時間退化的行為，而本文主要在於討論光纖在靜態應力作用下的疲勞現象，並使用CN模型加以描述光纖之退化模式。由於光纖之破壞機制為應力腐蝕，因此可以針對化學(腐蝕)和力學(應力強度因子)這兩領域各做不同的研究與發展。本文既是以化學方面的失效機制為出發點，再以CN模型描述光纖可靠度退化行為模式，並藉由所得到之參數與施加之應力或應變做討論，求其兩者之間的關係式，以推導出光纖壽命之預估公式。
並就所推導出的壽命預估公式與文獻所提之導入應力強度因子的概念所推導出之壽命預估公式做比較。在所施加之應力或應變為零與無限大時，本文所由CN模型所發展出的壽命預估公式，較能符合光纖退化之自然現象。

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