本文的主要架構，建立在以狀態限制函數配合蒙地卡羅法，分析類比電路系統的可靠度，並以低通濾波器為實例分析有關系統參數設計的可靠度。
考慮的系統包括兩種不同型式的Butterworth與Chebyshev低通濾波器，使用Sallen-Key電路做串級設計，在模擬中假設運算放大器為理想元件，電容電阻器等被動元件有製造上的精密度變異。首先給予訊號與雜訊分佈，然後決定濾波器的階數與設計規格，包括通過帶頻率與最大容許衰減、阻滯帶頻率與所需最小衰減以及截止頻率的設計，然後建立規格的限制函數，使用蒙地卡羅法對元件值變異分佈進行機率取樣模擬規格變異，符合規格限制的電路數除以取樣樣本數即可算出元件在不同精密度的影響下系統的的可靠度變化，並據此分析截止頻率的設計值。
此系統可靠度退化趨勢為單調遞減，與累積失效的可靠度退化相同，所以本文亦以本研究室所發展出之累積失效模式描述設計規格方面可靠度退化情形。

[1] M. Slamani, B. Kaminska, “Testing analog circuits by sensitivity computation,” IEEE, [3rd] European Conference, Design Automation, pp.532-537, 1992.
[2]R.V. White, “Component Tolerance And Circuit Performance: A Case Study,” IEEE, APEC ''93, Conference Proceedings 1993., Eighth Annual , 1993 , pp. 922 —927.
[3]X.T. Ling, R.W. Liu, “Novel Methods for Circuit Worst-Case Tolerance Analysis,” IEEE, Circuits and Systems I: Fundamental Theory and Applications, Vol. 43 4, pp. 272 —278, April 1996.
[4]W.M. Smith, “Worst Case Circuit Analysis-An Overview (Electronic Parts/Circuits Tolerance Analysis),” IEEE, Reliability and Maintainability Symposium Annual, pp. 326-334, 1996.
[5]H. McWilliams, “Utilization of Monte Carlo and Worst-case Computer Simulation Methods for Evaluation of Electronic Circuit Designs,” Computer Educ. J., vol. II, no. 3, pp. 17-20, Sept, 1992.
[6]L.A. Kamas, S.R. Sanders, “Reliability Analysis via Numerical Simulation of Power Electronic Circuits,” IEEE Computers in Power Electronics, 4th Workshop, pp. 175 —179, 1994.
[7]K.S. Wang, E.H. Wan and W.G. Yang, “A Preliminary investigation of New Mechanical Product Development Based on Reliability Theory,” Reliability Engineering and system Safety, Vol. 40, 1993, pp. 187-194.
[8]W.J. Kolarik, Creating quality concepts systems strategies and Tools, McGraw Hill, N. Y., 1995.
[9]K.S. Wang, S.T. chang, Y.C. Shen, “Dynamic Reliability Models for Fatique Crack Growth Problem,” Engineering Fracture Mechanics, Vol.54, No.4, pp.543-556, 1996.
[10]張豪麟, “系統動態可靠度與其失效率關係的探討,” 國立中央大學機械工程研究所碩士論文, 1999.
[11]J.D. Wang, T.S. Liu, ”Robot Accuracy Assessment Using Reliability Theory,” Journal of the Chinese Society of Mechanical Engineers,Vol.12,No.2,pp.188-195, 1991.
[12]石逸群, “累積失效與可靠度關係之探討,” 國立中央大學機械工程研究所碩士論文,2000.
[13]M. Kaneko, Y. Fujikawa, “Boundary search approach to parameter design for analog circuits,” Circuits and Systems, 1994. APCCAS ''94., IEEE Asia-Pacific Conference , 1994.
[14]R. Spence and R. Soin, “Tolerance Design of Electronic Circuits,” New York: Addison-Wesley, 1988.
[15]梁伯任, “材料強度退化與累積損傷之探討,” 國立中央大學機械工程研究所碩士論文, 2000.
[16]W.M. Smith, “Reliability and Maintainability Symposium,” 1996 Proceedings. International Symposium on Product Quality and Integrity, pp. 326 —334, 1996
[17]E. Lee, T. Wilson, “Methodology for Using Circuit Simulation in the Design and Development of Electronic Power Supplies,” IEEE Power Electronics Specialists Conference, pp.34-45, 1992.
[18]R. White, “An Introduction to Six Sigma with A Design Example,” IEEE APEC, pp.28-35, 1992.
[19]Richard Lee, “EMI filter design,” New York, 1996.
[20]何中庸, “濾波器分析與設計” 全華科技圖書公司, 1999.
[21]N.B. Hamida, B. Kaminska, “Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling,” IEEE, Test Conference, pp.652-661, 1993.
[22]J.N. Siddall, “Probabilistic Engineering Design Principle and Applications,” Marcel Dekker, Inc., New York,1983.
[23]林地財, “通訊濾波器原理與電腦輔助設計,” 全華圖書公司, 1996
[24]K. Okada, N. Onodera, “Statistical modeling of device characteristics with systematic fluctuation,” IEEE International Symposium, Circuits and Systems , Vol.2, pp.437-440, 2000.
[25]Finn Jensen, “Electronic Component Reliability,” New York, 1995.
[26]M.F. Kavanaugh, “Including the effects of component tolerances in the teaching of courses in introductory circuit design,” IEEE Transactions, Education Vol. 38, pp.361-364, 1995.