| 研究生: |
黃兆鍇 Zhau-Jian Huang |
|---|---|
| 論文名稱: |
共模干擾對儀表放大器之可靠度分析 |
| 指導教授: |
莊漢東
Han-tung Chuang |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 機械工程學系 Department of Mechanical Engineering |
| 畢業學年度: | 88 |
| 語文別: | 中文 |
| 論文頁數: | 75 |
| 中文關鍵詞: | 電磁干擾 、蒙地卡羅 、可靠度 |
| 相關次數: | 點閱:13 下載:0 |
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本文考慮的系統包括了此數位化溫度控制器之儀表放大器及要將其輸出訊號進行取樣的類比-數位取樣器,由可靠度的觀點評估外界共模干擾對於此系統的影響。
而考慮一個系統的可靠度,必須從此系統的功能著手,所以本文先根據取樣精度的條件定義其失效的機制,再以電磁干擾的定量描述方法根據應力與強度干擾理論(SSI)分析其可靠度。而分析可靠度一個重要的關鍵,就是以統計方法評估系統參數的隨機性對可靠度的影響,所以本文將採用蒙地卡羅分析法分析電路中電阻的誤差對系統所造成的影響為主軸討論其對系統可靠度的影響。同時,輸出訊號的取樣精度也牽連著此系統的可靠度,所以本文也會考慮不同的取樣精度對系統可靠度的曲線變化情形。對於共模干擾源的部分,本文假設一正弦電壓以共模方式輸入儀表放大器,然後使用 對儀表放大器進行共模增益頻率響應模擬、內部雜訊模擬及其電阻取樣。
而本文所分析的可靠度屬於一種靜態的系統初始可靠度隨著系統參數退化的情形,其退化的情形與累積失效模式描述動態可靠度呈單調遞減的情形類似,故本文也將系統可靠度與共模干擾振幅的關係圖以累積失效模式所衍生出來的初始可靠度方程式嵌合之。
[1] K.S.Wang,Wan E.H. and Yang W.G.,”A Preliminary investigation of New mechanical
Product Development Based on reliability Theory,”Reliability Engineering and System
Safety,Vol.40,pp.187-194,1993.
[2] K.S.Wang,C.S.Chen and J.Jhuang,”Dynamic Reliability Behavior for Sliding Wear of
Carburized Stell,”Reliability Engineering & System Safety,Vol.58,pp.31-41,1997.
[3] K.S.Wang , S.T.Chang and Y.C.Shen ,”Dynamic Reliability Models for Fatigue
Crack Growth Problem,”Engineering Fracture Mechanics”Vol.54,No.4, pp.543-556
,1996.
[4] Kapur ,K.C & Lamberson ,L.R.,”Reliability in Engineering Design” Chap 1,5?, John
Wiley & Sons,N.Y,1977.
[5] Elmer, E.Lewis ,”Introduction to Reliability Engineering”,John Wiley&Sons ,N.Y,1986.
[6] Shooman ,M.L.,”Probabilistic Reliability”:An Engineering Approach,
Mc-GrawHill,Inc.,N.Y,1968.
[7] Rao S.S.,”Reliability-Based Design”,McGraw-Hill,N.Y,1993.
[8] Kececioglu Dimitri “Reliability of Mechanical Components and Systems,”Nuclear
Engineering and Design”,Vol.9,pp.259-290,1972.
[9] Bompas-Smith,J.H.,”The Determination of Distributions that Describe the Failure of
Mechanical Component ,”Annals of Assurance Science,N.Y,1969.
[10] 王國雄,”系統演化與力學分析架構的類比”,中華民國第二十屆全國力學會議,
pp.viii-xv,1996.
[11] 許芳勳,”可靠度設計應用於標準差選取之最佳化研究”,國立中央大學碩士論
文,1990.
[12] 張豪麟,”系統動態可靠度退化模式之探討”,國立中央大學碩士論文,1999.
[13] 石逸群,”累積失效與可靠度關係之探討”,國立中央大學碩士論文 2000.
[14] Lori M.K.,Sanyuta B.,Barry W.J.,”Modeling of Common Mode Failure in Digital
Embedded” IEEE Reliability and Maintainability pp.350-357,2000.
[15] G.Masetti,S.Graffi,D.Golzio and ZS.M.kovacs-V.,”Failures Induced on
Analog Integrated Circuits By Conveyed Electromagnetic Interferences” Pergamon
Microelectron. Reliability.,Vol.36 No.7/8 pp.955-972,1996.
[16] S.Graffi, G.Masetti and A.Piovvccari,”Criteria To Reduced Failures Induced
from Conveyed Electromagnetic Interference on CMOS Operational Amplifiers”
Pergaman Microelectron. Reliability .,Vol.37 No1., pp 95-113,1997.
[17] Canio Dichirico & Chanan Singh,”Reliability Analysis of Transmission Lines With Common
Mode Failures when Repair Times Are Arbitrarily Distributed”,IEEE Transactions on Power
Systems, Vol.3,No.3,1988.
[18] B.Ross Barmish,”New Tolls for Robustness of Linear Systems”,Macmillan Publishing
Company.
[19] George A.Hazelrigg,”Systems Engineering : An Approach To Information-Based Design”,
,PRENTICE HALL.
[20] Franz Monnssen,”MicroSim PSPice with Circuot Analysis”,PRENTICE HALL.
[21] Thomas M.Frederiksen ,”Intuitive Operational Amplifiers”,McGraw-Hill Book Company.
[22] Frederick M. Tesche, Micheal V.Ianoz, Torbjorn Karlsson,”EMC Analysis Methods
Computational Modles”,John Wiley & Sons,INC.
[23] Tim Williams ,”EMC for Product Designers”,NEWNES.
[24] Laszlo Tihanyi,”Electromagnetic Compatibility in Power Electronetics”,IEEE PRESS.
[25] Ramon Pallas-Areny, John G.Webster ,”Analog Signal Processing”,John Wiley & Sons
,INC.
[26] Robert Boylestad & Louis Nashelsky,”Electronic Devices and Circuit Theory”.
[27] 林國榮,”電磁干擾及控制”,全華科技圖書.
[28] 卓聖鵬,”EMC的基礎與實踐”,全華科技圖書.
[29] 原著:剛村迪夫,譯者:陳連春,”運算放大器應用設計鐵則”,建興出版社.
[30] 陳連春編譯,”AD/DA電路變換技術”,建興出版社.
[31] 盧勤庸編著,“電子電路模擬使用PSpice A/D”,全華科技圖書.
[32] 林文斌,”數位化溫度控制器之開發”,國立中央大學碩士論文 1999.
[33] 江漢清,”判別分析在參數測試上之應用”,私立中華大學碩士論文1999.