| 研究生: |
陳銘勝 Ming-Sheng Chen |
|---|---|
| 論文名稱: |
氮化鎵發光二極體製程技術之研究 Process of GaN-based Light-emitting Diode |
| 指導教授: |
綦振瀛
Jen-inn Chyi |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
資訊電機學院 - 電機工程學系 Department of Electrical Engineering |
| 畢業學年度: | 92 |
| 語文別: | 中文 |
| 論文頁數: | 67 |
| 中文關鍵詞: | 光取出效率 、發光二極體 、氮化鎵 、n型氮化鎵歐姆接觸 |
| 外文關鍵詞: | GaN, LED, extraction effciency, n-type GaN ohmic contact |
| 相關次數: | 點閱:10 下載:0 |
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本篇論文分別針對氮化鎵發光二極體製程技術中之n型歐姆接觸電極與提升光取出效率方面進行研究分析。在n型歐姆接觸方面,製作Ti/WSix/Ti/Au歐姆接觸電極,在Ti/WSi0.05/Ti/Au (200/400/200/2000 Å)於氮氣環境下800oC、3分鐘熱處理後,可得特徵電阻值約1×10-6 Ω-cm2,不論在穩定性和反射率方面皆較傳統的鈦/鋁/鈦/金電極為佳;在提升光取出效率方面,利用表面圖樣化的方式增進氮化鎵發光二極體光取出效率,由模擬計算可知其對光取出效率有20%的提升,然而由於實驗技術未充分掌握,使得結果不如預期,若能將圖樣的製作技術加改善,必能對發光二極體的光取出效率有所助益。
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[1] H. Morkoc, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov, and M. Burns, J. Appl.
Phys. 76, 1363 (1994)
[2] S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H.
Kiyoku, Y. Sugimoto, T. Kozaki, H. Umemoto, M. Sano, and K. Chocho, Appl. Phys. Lett. 72, 2014 (1998)
[3] M. Razeghi and A. Rogalski, J. Appl. Phys. 79, 7433 (1996)
[4] Y. F. Wu, B. P. Keller, P. Fini, S. Keller, T. J. Jenkins, L. T. Kehias, S. P. Denbaars, and U. K. Mishra, IEEE Electron Device Lett. 19, 50 (1998)
[5] J. S. Foresi and T. D. Moustakas, Appl. Phys. Lett. 82, 2859 (1993)
[6] M. E. Lin, Z. Ma, F. Y. Huang, Z. F. Fan, L. H. Allen, and H. MorkoG, Appl. Phys. Lett. 64, 1003 (1994)
[7] S. Ruvimov, Z. Lilliental-Weber, J. Washburn, K. J. Duxstad, E. E. Haller, Z.-F. Fan, S. N. Mohammad, W. Kim, O. Aktas, A. E. Botchkarev, and H. Morkoc¸, Appl. Phys. Lett. 69, 2582 (1996)
[8] B. P. Luther, S. E. Mohney, T. N. Jackson, M. Asif Khan, Q. Chen, and J. W. Yang, Appl. Phys. Lett. 70, 57 (1997)
[9] Dong-Feng Wang, Feng Shiwei, C. Lu, Abhishek Motayed, Muzar Jah, and S.
Noor Mohammad, J. Appl. Phys., 89, 6214 (2001)
[10] V. Kumar, L. Zhou, D. Selvanathan, and I. Adesida, J. Appl. Phys., 92, 1712 (2002)
[11] Zhifang Fan, S. Noor Mohammad, Wook Kim, O¨ zgu¨ r Aktas, Andrei E. Botchkarev, and Hadis Morkoc¸ Appl. Phys. Lett. 68 , 1672 (1996)
[12 ] M. Zhao, R. L. Jiang, P. Chen, D. J. Xi, H. Q. Yu, B. Shen, R. Zhang, Y. Shi, S. L. Gu,and Y. D. Zheng, Appl. Phys. Lett., 79, 218 (2001)
[13] Luo and F. Ren, R. C. Fitch, J. K. Gillespie, T. Jenkins, J. Sewell, D. Via, and A. Crespo, A. G. Baca and R. D. Briggs, D. Gotthold, R. Birkhahn, and B. Peres, S. J. Pearton, Appl. Phys. Lett., 82, 3910 (2003)
[14] I. Schnitzer and E. Yablonovitch, C. Caneau, T. J. Gmitter, and A. Scherer, Appl. Phys. Lett. 63 2174 (1993)
[15] Masayoshi Koike, Naoki Shibata, Hisaki Kato, and Yuji Takahashi, IEEE JOURNAL ON SELECTED TOPICS IN QUANTUM ELECTRONICS, 8, 271 (2002)
[16] F. Braun, Annal. Phys. Chem. 153, 556 (1874)
[17] W. Schottky, Naturwissenschaften 26, 843 (1938)
[18] Hadis Morkoc, Nitride Semiconductors and Devices, Springer, pp.196 (1999)
[19] Ralph Williams, Modern GaAs Processing Methods, Artech House, Boston London, pp.235 (1990)
[20] M. W. Cole, F. Ren, S. J. Peaton, J. Electrochem. Soc. 144, L275 (1997)
[21] B. Luo, F. Ren, R. C. Fitch, J. K. Gillespie, T. Jenkins, J. Sewell, D. Via, A. Crespo, A. G. Baca, R. D. Briggs, D. Gotthold, R. Birkhahn, B. Peres, and S. J. Pearton, Appl. Phys. Lett. 82, 3910 (2003)
[22] Dae-Woo Kim and Hong Koo Baik, Appl. Phys. Lett., 77, 1011 (2000)
[23] X. A. Cao and S. J. Pearton, A. P. Zhang, G. T. Dang, and F. Ren, R. J. Shul and L. Zhang, R. Hickman and J. M. Van Hove, Appl. Phys. Lett., Vol. 75, 2569 (1999)