| 研究生: |
呂東榮 Dong-Jung Lu |
|---|---|
| 論文名稱: |
一個以取樣方式提供可程式化邏輯陣列功能除錯所需之完全觀察度的方法 A Snapshot Method to Provide Full Visibility for Functional Debugging Using FPGA |
| 指導教授: |
劉建男
Chien-Nan Liu |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
資訊電機學院 - 電機工程學系 Department of Electrical Engineering |
| 畢業學年度: | 92 |
| 語文別: | 英文 |
| 論文頁數: | 62 |
| 中文關鍵詞: | 取樣 、可程式化邏輯陣列 、重建 |
| 外文關鍵詞: | snapshot, FPGA, reconstruct |
| 相關次數: | 點閱:10 下載:0 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
直到現在,邏輯模擬器依然是最受歡迎的驗證工具。雖然它們可以在驗證過程中提供使用者對於被驗證之電路有完全的控制性與觀察性,但是當有大量的輸入測試訊號時,整個模擬速度將會太慢。此時若使用像可程式化邏輯陣列這樣的仿真工具,將可得到更高的模擬速度。然而在速度獲得提升之後,另外一個問題也同時產生,那就是可程式化邏輯陣列所能提供之觀察度實在太低,如此將導致驗證上的困難變高。
所以,在這篇論文中,我們提出另外一種方法來改善上述的一些短處。運用此方法,我們會記錄可程式化邏輯陣列內部的行為,之後在邏輯模擬器上跑出我們所想要之區段的波形。因為大部份的過程花費都是在可程式化邏輯陣列上,所以使用者仍可得到高速的好處。而且,對電路之完全觀察度以及相對於硬體之較佳驗證環境則可以在軟體的邏輯模擬器上獲得。
透過實驗數據的說明,可以看到使用我們所提之方法的效率。
Until now, logic simulators are still the most popular verification tools. Although they can provide full controllability and observability during the verification process, its running speed is too slow for large amounts of input patterns. Using hardware emulation such as FPGA (field programmable gate array) can have higher simulation speed. However, it is very hard to debug using this approach due to poor visibility in FPGAs. Therefore, in this thesis, we propose another approach to “record” the internal behaviors of an FPGA and “replay” the interesting period of time in a software simulator. In this way, we can still have high simulation speed because most simulation efforts are still finished in the FPGA. Moreover, full visibility and better debugging environment can be provided in the software simulation. The experimental results have shown the efficiency of using our approach.
[1] Cadence Design System Corporation., Palladium Data sheet, http://www.cadence.com/datasheets/4510C_IncisivePalladium_fnl.pdf
[2] Mentor Graphics Corporation, Vstation Pro Emulator, http://www.mentor.com/vstation/vstation_pro.html
[3] IEEE, Standard 1149.1a, IEEE standard Test Access Port and Boundary-Scan Architecture, revised, 1993.
[4] Altera Corporation, Signal Tap II Embedded Logic Analyzer, http://www.altera.com/products/software/pld/design/verification/signaltap2
/sig-index.html
[5] Xilinx Corporation, Chip Scope On Chip Debug Integrated Logic Analyzer, http://www.xilinx.com/ise/verification/chipscope_pro_glance2.htm
[6] Anurag Tiwari, Karen A. Tomko, “Scan-chain Based Watch-points for Efficient Run-Time Debugging and Verification of FPGA Designs”, ASPDAC, 2003.
[7] Joshua Marantz, “Enhanced Visibility and Performance in Functional Verification by Reconstruction”, Proc. DAC’98, San Francisco, CA
[8] ITC’99 test suite, Electric CAD & Reliability Group, http://www.cad.polito.it/tools/#bench
[9] Temento Corporation, DiaLite Instrumentation for Verification on FPGAs, http://www.temento.com/solutions/fpga.php
[10] Michael L. Bushnell and Vishwani D. Agrawal, “Essentials of Electronic Testing”, Kluwer Academic Publishers, 2000.
[11] Xilinx Corporation, Readback Function, XAPP138 : Virtex Configuration and Readback, http://www.xilinx.com/ipcenter/catalog/search/reference
/xapp138_virtex_configuration_and_readback.htm
[12] Agilent Technologies, Trace Port Analyzer for On Chip Design Verification With Xilinx FPGAs, http://cp.literature.agilent.com/litweb/pdf/5988-9434EN.pdf
[13] Altera Corporation, Quartus ⅡDesign Software for Altera FPGAs, http://www.altera.com/literature/manual/intro_to_quartus2.pdf
[14] Model Technology Corporation, ModelSim 5.5 e, Simulation Software, http://www.model.com/products/se.asp
[15] Altera Corporation, Nios Development Board_APEX Edition, http://www.altera.com/literature/ds/ds_nios_board_apex_20k200e.pdf
[16] Altera Corporation, ByteBlasterMV Parallel Port Download Cable, http://www.altera.com/literature/ds/dsbytemv.pdf
[17] Integrated Device Technology, Data Sheet of 3.3 V CMOS Asynchronous SRAM, http://www1.idt.com/pcms/tempDocs/71V016_DS_6428.pdf
[18] Flottes, M. L., Pires, R., Rouzeyre, B., Volpe, L., “Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique”, Design, Automation and Test in Europe, 1998.
[19] Mukherjee, D., Pedram, M., Breuer, M., “Control Strategies for Chip-based DFT/BIST Hardware”, Test Conference, 1994.
[20] Chih-Chang Lin, Marek-Sadowska, M., Lee, M. T.-C., Kuang-Chien Chen, “Cost-free Scan: A Low Overhead Scan Path Design”, Computer-Aided Design of Integrated Circuits and Systems”, 1998.
[21] Verisity Corporation, Xcite Simulation Acceleration platform, http://www.verisity.com/products/xcite.html