本論文主要研究於即時性多角度光譜系統之架設、校正和量測，系統由物鏡、無焦系統、光學狹縫、光柵與互補式金屬氧化物半導體晶片所組成，藉由物鏡使不同角度的光導入系統，將對其作空間濾波、波長分光與匹配光束大小，最後可得波長與角度之二為空間頻譜。
由於系統受光學元件響應影響，導致光強度分布失真，故藉由光纖校正其強度。電致發光之校正頻譜沿用學長之研究結果，在此以紅光與綠光OLED作為待測物，驗證校正頻譜之正確性。而光致發光為區域發光難以定義發光面積，需再次對其光強度做校正，校正方法同樣是以光纖進行校正，並在以橘光材料驗正光致發光校正頻譜之正確性。反射率量測為相對強度之量測，以高反射率且反射率較不會隨角度飄移之銀鏡當作反射率基準，量測方法為使用系統擷取銀鏡與待測樣品之二維頻譜，兩者對除後在乘上銀鏡實際之反射率及可得到樣品之空間反射頻譜。
即時性多角度光譜量測系統相較於光纖量測有諸多優點，除了能迅速取得平面光源空間頻譜外，更可藉由系統量測出零度角之反射率或是低角度下的光致發光頻譜，上述優點在一般光纖量測下較難以達成，最後本論文以提出此系統可用於量測角度相關元件以及OLED量測之可行性。

This thesis focuses on the establishment, calibration and measurement of one-snap multi-angle spectroscopy optical system, the system consists of an objective lens, an afocal system, an optical slit, a grating and a Complementary Metal-Oxide-Semiconductor (CMOS) chip, the objective lens is used to collect different angles of light into the system, pass through spatially filter, separates the wavelength and match the beam size. Finally, we can obtain spatial spectrum of two dimensions which are wavelength and angle.
The light intensity distribution is distorted since the system is affected by the response of the optical element, so we calibrate system intensity by optical fiber.
The calibrating matrix of electroluminescence follows the previous research results, in this thesis the red and green OLEDs are used to check the correctness of the calibrating matrix. Photoluminescence is difficult to define the area of illumination, it is necessary to calibrate its light intensity again. The calibration method is also calibrated by fiber, and using orange light material verification of the correctness of the photoluminescence calibrating matrix. The reflectance measurement is a measure of relative intensity, this system uses a silver mirror as the reflectivity reference. Using the system to capture two-dimensional spectrum of the silver mirror and the sample, separately. Spectrum of the sample divided by spectrum of the silver mirror is the reflectance of sample.
One-snap multi-angle spectroscopy optical system have many advantages over fiber. In addition to quickly obtaining the spatial spectrum of the planar light source, the system can measure the reflectance at a zero angle or the photoluminescence spectrum at a low angle. The above advantages are more difficult to achieve under general fiber measurement. Finally, this paper proposes that this system can be used to measure the angle resolved components and OLEDs measurement.

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