跳到主要內容

簡易檢索 / 詳目顯示

研究生: 李東哲
Dong-Jer Lee
論文名稱: 溫度對DWDM濾光片光學穩定性研究
指導教授: 李正中
Cheng-Chung Lee
口試委員:
學位類別: 碩士
Master
系所名稱: 理學院 - 光電科學與工程學系
Department of Optics and Photonics
畢業學年度: 93
語文別: 中文
論文頁數: 47
中文關鍵詞: 溫飄
外文關鍵詞: DWDM
相關次數: 點閱:6下載:0
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  • 摘要
    DWDM薄膜干涉濾光片已廣泛應用於光纖通訊系統中,為提高光纖通訊系統之可靠度,溫度對於其光學穩定性的影響就顯得越來越重要。符合國際規範的100GHz DWDM濾光片,其溫飄值必須要小於1pm/℃。本論文利用不同膜層設計、不同基板種類及鍍膜材料所製鍍五腔式之DWDM濾光片來做溫飄量測,找出符合商用規格的100GHz DWDM濾光片。從本文研究中發現基板尺寸大小、膜層厚度以及選用的高折射率材料及基板種類皆會影響溫飄值,鍍膜材料使用氧化鈮(Nb2O5)及氧化矽(SiO2),玻璃基板為WMS02所製鍍出177層的100GHz DWDM濾光片,其尺寸為1.4mm×1.4mm×1.0mm,溫飄值0.148pm/℃為最佳值。


    Abstract
    DWDM filters have been widely used in fiber-communication system. In order to increase its reliability, the temperature effect to the optical stability of the DWDM filters will become more and more important. The TSCW(Temperature Shift of Central Wavelength) of 100GHz DWDM filters in international specification is less than 1pm/℃. The main subject of this study is to measure the five cavities of different thin film design, different type of substrate, and different coating material in order to choose the 100GHz DWDM filters that fit the commercial specification. From this study, we find that the size of substrate, thickness of thin film, type of substrate, and the chosen high refractive index material may influence the TSCW. The best value of TSCW is 0.418pm/℃ which coating materials are Nb2O5 and SiO2, the number of the thin film layers is 117, substrate is WMS02, and the size is 1.4mm×1.4mm×1.0mm.

    目錄 摘要....................................................................................................................Ⅰ 致謝....................................................................................................................Ⅲ 目錄....................................................................................................................Ⅳ 圖目錄................................................................................................................Ⅶ 表目錄................................................................................................................Ⅸ 第一章 緒論 1 1-1 研究動機 1 1-2 本文架構 3 第二章 基本理論分析 4 2-1 DWDM濾光片理論及其設計和製鍍 4 2-1-1 Fabry-Perot之DWDM濾光片(2) 4 2-1-2 DWDM濾光片設計 7 2-2 DWDM濾光片製鍍 9 2-2-1 製鍍基本規格之基本要求 9 2-2-2 製鍍系統簡介 11 2-3 NBPF(Narrow Band Pass Filter)窄帶濾光片之溫飄基本理論分析 13 2-4 理論修正 18 第三章 溫飄光譜量測系統與其他量測工具 22 3-1 溫飄光譜量測系統 22 3-1-1系統要求 22 3-2 量測系統架構 24 3-3 顯微鏡干涉儀(MHT-Ⅲ WYKO) 27 3-3-1 WYKO工作原理(10) 27 3-3-2 WYKO系統架構與曲率量測 29 4-1 樣品說明 30 4-2 實驗分析 31 4-2-1 不同製鍍機台溫飄值比較 32 4-2-2 不同基板種類溫飄值比較 34 4-2-3 不同基板厚度溫飄值比較 36 4-2-4 不同膜層設計溫飄值比較 38 4-2-5 對於負溫飄值的比較 40 4-2-6 不同高折射率材料溫飄值比較(基板WMS15) 41 4-2-7 DWDM濾光片表面曲率量測 42 第五章 結論 44 參考文獻 46

    參考文獻
    1. “Generic Requirements for Fiber Optics Branching Components”, Bellcore GR-1209-CORE,Issue 2, February 1998.
    2. 李正中, “薄膜光學與鍍膜技術” , 藝軒圖書出版社, p.202-218,(1999).
    3. 朱正煒, “DWDM干涉濾光片之設計及製作”,光學工程第六十八期, 88年12月, P.40-45
    4. Haruo Takashashi,“Temperature stability of thin-film narrow-bandpass filters produced by ion-assisted deposition”,Applied Optics, Vol.34, pp.667-675,February 1995﹒
    5. M. Ohring, “The Materials Science of Thin Films” , Academic Press:San Diego, p.407, 1992.
    6. J. R. McNeil, A. C. Barron, S. R. Wilson, and W. C. Herrmann, Jr.,“Ion-assisted deposition of optical thin films: low energy vs high energy bombardment,”Appl. Opt. 23, 552–559 119842.
    7. 許華珍, “光纖通訊帶通濾光片光譜量測系統之建立與分析” ,國立中央大學光電所碩士論文,民國91年。
    8. Vittorio Bertogalli,E.U. Wagemann,EMMERICH Müller,Edgar Leckel, “Testing passive DWDM components:uncertainties in swept-wavelength measurement system”,OFC 2000.
    9. Steven L. Prins, Alan C. Barron, William C. Herrmann, John R. McNeil, “Effect of stress on performance of dense wavelength division multiplexing filters: optical properties”, Appl. Opt.43,626-632(2004).
    10. Paul J. Caber, Stephen J. Martinek, Robert J.Neimann, “A new interferometric profiler for smooth and rough surfaces”, WYKO Corporation 2650 E. Elvira Road Tucson,AZ 85706.
    11. 田春林,”光學薄膜應力與熱膨脹係數量測之研究”,國立中央大學光電所博士論文,民國89 年。
    12. Steven L. Prins, Alan C. Barron, William C. Herrmann, and John R. McNeil, “Effect of stress on performance of dense wavelength division multiplexing filters: thermal properties”,Appl. Opt.43,633-637(2004).
    13. Michel Lequime, Remy Parmentier, Fabien Lemarchand, and Claude Amra, “Toward tunable thin-film filters for wavelength division multiplexing applications”,Appl. Opt.41,3277-3284(2002).
    14. Sung-Hwa Kim and Chang Kwon Hwangbo, “Temperature Dependence of Transmission Center Wavelength of Narrow Bandpass Filters Prepared by Plasma Ion-Assisted Deposition”, J. Korean Phys. Soc.45,93-98(2004).

    QR CODE
    :::