摘要
在此論文中，我們提出一個新的方法來量測高速電路。我們的量測方法分為兩部分。第一部分為eye diagram的量測方法，我們可由此方法得知待測信號的大小、雜訊大小、以及抖動(jitter)大小。第二部分為eye mask的量測方法，藉由此方法，我們可得到待測信號的大小和BER。然後，我們可判斷出待測訊號是否能夠通過eye mask的測試。
除了理論的推導外，我們將會利用軟體模擬來驗證我們所提出的方法，並實際以硬體實現來驗證此方法的可行性。我們利用三種不同的方法產生欲輸入的待測信號，第一個訊號是利用MATLAB產生的Gaussian noise。第二個訊號是LFSR產生，再經過USB2.0的版子所得的輸入訊號。最後一個訊號則是由logic analyzer產生的random noise。由我們的量測結果中，我們可證明此方法的正確性。

Abstract
In this thesis, we proposed a novel methodology to test high speed circuit. We divide our testing methodology into two parts. The first one is the eye diagram testing methodology. We can obtain the signal mean, signal noise, and jitter from eye diagram testing. The second part is the eye mask testing methodology. By this methodology, we can obtain the signal noise and BER of the DUT. Then we can determine if the signals pass the eye mask test or not.
In additional to the theory derivation, we will verify the methodology by software simulation and hardware emulation to assure the feasibility. The input signals are generated by three methods. The first signals are generated by MATLAB program with Gaussian noise. The second emulated signals are generated from LFSR and pass through USB2.0 board. The last emulated signals are generated by logic analyzer with random noise. The test results show the correctness of our probability deviation and verify that out methodology can work.

Bibliography
[1] Mark Burns, Gordon W. Roberts “An introduction to Mixed-Signal IC test and Measurement”, OXFORD UNIVERSITY PRESS 2001.
[2] Arabi K., Kaminska B, Rzeszut J. “BIST for D/A and A/D converters”, IEEE Design & Test of Computers, Volume: 13 Issue:4, winter 1996 Page(s): 40-49.
[3] Arabi, K, “A built-in self-test approach for medium to high-resolution digital-to-analog converters” Test Symposium, 1994, Proceedings of the Third Asian, 1994 Page(s): 373-378.
[4] Hassan, I.H.S.; Arabi, K.; Kaminska, B. “Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation” VLSI in Computers and Processors, 1998. ICCD ’98. Proceedings. International Conference on, 1998, Page(s): 40-46.
[5] Donald F, Murray C, Michael Nash, “Critical parameters for high-performance dynamic response measurements” International test conference 1990, Page(s): 462-471.
[6] Branson, C.W. “Integrating tester pin electronics” IEEE Design & Test of Computers, Volume: 7 Issue: 2, April 1990 Page(s): 4-14.
[7] Gasbarro, J.A.; Horowitz, M.A. “Integrated pin electronics for VLSI functional testers” Custom Integrated Circuits Conference, 1998, Proceedings of the IEEE, 1998, 1998 Page(s): 16.2/1-16.2/4.
[8] Itakura, T, “Effects of the sampling pulse width on the frequency characteristics of a sample-and-hold circuit” Circuits, Devices and Systems, IEEE Proceedings- Volume: 1414, Aug. 1994, Page(s): 328-336.
[9] De Rycke, I.; De Baets, J.; Doutreloigne, J.; Van Calster, A.; Vanfleteren, J. “The realization and evaluation of poly-CdSe TFT driving circuits” Display Research Conference, 1998., Conference Record of the 1998 International, 1998 Page(s): 70-73
[10] Lo, W.M.; Kung, A.; Chan, Y.; Wong, V.W.S. “LCD Driver Design For Mobile Communications System” Information Display, 1997, Proceedings of the Fourth Asian Symposium on Page(s): 91-97
[11] Valencic, V.; Ballan, H.; Deval, P.; Hochet, B.; Declercq, M. “50-V LCD driver integrated in standard 5-V CMOS process” Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994, 1994 Page(s): 578-581
[12] Byong-Deok Choi; Heuisung Jang; Oh-Kyong Kwon; Hong-Gyu Kim; Myung-Jin Soh, “Design of poly-Si TFT-LCD panel with integrated driver circuits for an HDTV/XGA projection system” Consumer Electronics, IEEE Transactions on, Volume: 46 Issue:1, Feb. 2000 Page(s): 95-104
[13] Mahoney, A.W.; Doyle, F.J., III; Ramkrishna, D, “Inverse problem approach to modeling of particulate systems” American Control Conference, 2000. Proceedings of the 2000, Volume: 3, 2000 Page(s): 1727-1731 vol.s
[14] Shima, T.; Itakura, T.; Yamada, S.; Minamizaki, H.; Ishioka, T, “Principle and applications of an autocharge-compensated sample and hold circuit” Solid-State Circuits, IEEE Journal of, Volume: 30 Issue: 8, Aug. 1995 Page(s):906-912
[15] Shima, T.; Itakura, T.; Minamizaki, H.; Yagi, T.; Maruyama, T, “TFT-LCD panel driver IC using dynamic function shuffling technique” Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International, 1997 Page(s):192-193, 455
[16] Watanabe, A.; Maekawa, M.; Hamada, M.; Hirase, J, “High precision testing method of mixed signal device” Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE, 1994 Page(s): 1284-1288 vol.3
[17] Chua-Chin Wang, Chi-Feng Wu, Sheng-Hua Chen; Chia-Hsiung Kao “In-sawing-lane multi-level BIST for known good dies of LCD drivers” Electronics Letters, Colume: 35 Issue: 18, 2 Sept. 1999 Page(s): 1543-1544
[18] Kac, U.; Novak, F.; Macek, S.; Zarnik, M.S. “Alternative test methods using IEEE 1149.4” Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings, 2000 Page(s): 463-467
[19] “IEEE standard for mixed-signal test bus”, IEEE Std 1149.4-1999, 28 March 2000