跳到主要內容

簡易檢索 / 詳目顯示

回結果列表
研究生： 祁子年
Tsu-Nien Chi
論文名稱： 使用雙埠網路分析儀量測四埠與差動元件之研究
Characterization of Four-port and Differential Circuits Using Two-port Vector Network Analyzer
指導教授： 邱煥凱
Hwann-Kaeo Chiou
口試委員:
學位類別： 碩士
Master
系所名稱： 資訊電機學院 - 通訊工程學系在職專班
Executive Master of Communication Engineering
畢業學年度： 96
語文別： 中文
論文頁數： 89
中文關鍵詞： 網路分析儀 、平衡 、差動 、四埠
外文關鍵詞： unbalance, balance, VNA, Differential, Vector Network Analyzer
相關次數： 點閱：18  下載：0 
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報

    • 因應科技的進步，高速的數位電路應用愈趨廣泛，傳輸速度也日益加快，以電腦週邊為例，為了提昇整體效能，中央處理器到顯像控制的PCI-Express2、硬碟資料存取的SATA2/ SATA3介面、及高畫質影像傳輸的HDMI 1.3/ Display port、網際網路遠距傳輸的10GBE乙太網路介面，速度需求從3 GHz開始一直到10 GHz，正在制定中的規格皆有向更高速發展的趨勢。因應高速、低耗電及抗雜訊的考量下，電路的設計上都走向差動或平衡式的方向發展，對應在SATA及HDMI協會的規範定義上，差動式的 S 參數已漸成為必測的規格。對應在傳統的 S 參數網路分析上，並無完整平衡電路的校正及量測解決方案，但從2001年以來，陸續有使用單一信號源模擬及雙信號源真實地達到差動網路分析儀問世。
    為了延續傳統雙埠網路分析儀的再利用性，本文是以傳統的兩埠網路分析儀作為主體，透過硬體架構的微波切換器，達成四埠差動式的量測，為了驗證此方法的精確度，我們以時域反射的原理，找出等效的電路並透過ADS模擬方式將誤差項移除，實驗中，以兩種不同的傳輸線及晶圓上的放大器做為範例，將結果與實際四埠的網路分析儀做分析比較，並對這幾種量測模式做綜合的討論。

    When technologies have been moving very fast still high speed digital application becomes more and more popular in different applications. PC peripheral as good example, in order to improve the whole performance, we should link each component in efficient way. For CPU and VGA card, we have PCI-Express2 interface in front side bus. For data storage, we have SATA2/ SATA3 to interface with H.D.D. data transferring. For Display, there is high quality video technology as HDMI 1.3 and display port. For internet, we have 10 Gbps Ethernet as optical fiber communication to reach longer distance than before. The speed requests from 3 GHz to 10 GHz and later application will definitely need higher speed to fulfill bandwidth requirement. To make high speed dream world real, digital circuit designs dominate the differential topology which shows benefit of low power consumption and noise suppression. As test standard defined by SATA or HDMI society, mixed-mode S-parameter is one of the necessary items for applying the certification logo. But as compared to traditional Vector Network Analyzer, its 2-port and single ended structure cannot meet modern applications. Another choice is using virtual or true differential 4-port VNA announced after 2001.
    In order to reutilize the 2-port VNA, we generate the test set combined with microwave switches. With hardware switching function, we defined the individual signal path that could leverage 4-port differential measurement. We also use TDR technique in time domain platform to verify the measurement accuracy. Furthermore, this technique also provides the methodology of equivalent circuit that for further ADS simulation. In this thesis, we utilize two types of transmission line and an on-wafer LNA as the device under test, to prove the proposed algorithm, and we also use real 4-port VNA as reference for performance verification.

    第一章 網路分析儀架構 9 1. 向量網路分析 9 2. 網路分析儀的硬體介紹 13 3. 誤差項來源及校正 18 4. 平衡式網路分析 21 第二章 實驗目的及方法 31 1. 模擬四埠網路分析儀硬體架構 31 2. 2對4微波切換器矩陣 32 3. I/O 控制程式設計 43 4. 校正及誤差項移除 46 第三章 實驗結果 51 1. 非平衡式傳輸線實測結果對照 51 2. 平衡傳輸線實測結果對照 55 3. 傳輸線在時域反射的對照分析 57 4. 晶圓上平衡式放大器實測結果對照 65 第四章 分析及討論 68 1. 誤差來源分析 68 2. 誤差模型的建立 71 3. 修正後的量測結果 76 4. 各款四埠網路分析儀比較 79 第五章 結論 85 第六章 未來與展望 86 參考文獻 87

    1. D. E. Bockelmen and W. R. Eisenstadt, “Pure-Mode Network Analyzer for On Wafer Measurement of Mixed-mode S-parameter pf Differential Circuits,” IEEE Trans. Microwave Theory Tech,. Vol 43, pp. 1071-1077, 1997.
    2. W. Fan, A. C. Lu, L. L. Wai and B. K. Lok, “Mixed-Mode S-parameter Characterization of Differential Structures,” Electronics Packaging Technology, 2003 5th Conference, pp 533 – 537, 2003.
    3. D. E. Bockelmen and W. R. Eisenstadt, “Calibration and Verification of the Pure-Mode Vector Network Analyzer,” IEEE Trans. Microwave Theory Tech,. Vol 46, pp. 1009-1012, 1998.
    4. D. M. Pozer, “Chapter 4: Microwave Network Analysis,” Microwave Engineering 2nd Edition, pp 196 – 205, 1998.
    5. P. Ferrari, and G. Angenieux, “Calibration of a Time-Domain Network Analyzer: A New Approach,” IEEE Transactions on Instrumentation and Measurement, Vol. 49, No.1. pp 178-187, 2000.
    6. “Differential Impedance Measurement with Time Domain Reflectometry,” Application Note 1382-5, Agilent Technologies, 2002.
    7. W. Eisenstadt, B. Stengel, and B. M. Thompson, “Microwave Differential Circuit Design Using Mixed-Mode S-Parameters,” Artech House Inc. 2006.
    8. W. L. Williams, R. C. Compton, and D. B. Rutledge, “Elf: Computer Automation and Error Correction for a Microwave Network Analyzer,” IEEE Transactions on Instrumentation and Measurement, Vol. 37, No.1. pp 95-99, 1988.
    9. W. Su, Sedik M. Riad, “Calibration of Time Domain Network Analyzers,” IEEE Transactions on Instrumentation and Measurement, Vol 42. No. 2. pp 157-161, 1993.
    10. F. Sanpietro, A. Ferrero, U. Pisani and L. Brunetti, ”Accuracy of a Multiport Network Analyzer,” IEEE Transactions on Instrumentation and Measurement, Vol. 44. No. 2. pp 304-307, 1995.
    11. “Time Domain Reflectometry Theory”, Application Note 1304-2, Agilent Technologies, 2006.
    12. “Agilent VEE pro User’s Guide,” Agilent Manual part number E2120-90011, Agilent Technologies, 2004.
    13. “VEE Advanced Techniques,” Agilent User Manual Edition 2, Agilent Technologies, 2004.
    14. “Agilent E5070B/E5071B ENA Series RF Network Analyzers User’s Guide,” 9th edition, Agilent Part number E5070-90410, Agilent Technologies, 2006.
    15. “Agilent E5070B/E5071B ENA Series RF Network Analyzers Programmer’s Guide,” 7th edition, Agilent Part number E5070-90092, Agilent Technologies, 2006.
    16. C. F. Coombs, Jr., “Electronic Instrument Hand Book 3rd edition,” McGraw- Hill 1999.
    17. “Understanding the Fundamental Principles of Vector Network Analysis,” Application Note 1287-1, Agilent Technologies, 2001.
    18. “Exploring the Architectures of Network Analyzers,” Application Note 1287-2, Agilent Technologies, 2003.
    19. “Applying Error Correction to Network Analyzer Measurements,” Application Note 1287-3, Agilent Technologies, 2002.
    20. “Hints for making Better Network Analyzer Measurements,” Application Note 1291-1, Agilent Technologies, 2002.
    21. “Network Analyzer Measurements: Filter and Amplifier Examples,” Application Note 1287-4, Agilent Technologies, 2001.
    22. “Using a Network Analyzer to Characterize High-Power Components,” Application Note 1287-6, Agilent Technologies, 2004.
    23. “Improving Network Analyzer Measurements of Frequency - Translating Devices,” Application Note 1287-7, Agilent Technologies, 2003.
    24. “In-Fixture Measurement Using Vector Network Analyzers,” Application Note 1287-9, Agilent Technologies, 2007.
    25. “Simplified Filter Tuning Using Time Domain,” Application Note 1287-8, Agilent Technologies, 2001.
    26. “Agilent De-Embedding and Embedding S-Parameter Network Using a Vector Network Analyzer,” Application Note 1364-1, Agilent Technologies, 2002.
    27. “An Introduction to Multi-port and Balanced Devices Measurements,” Application Note 1373-1, Agilent Technologies, 2002.
    28. “MS462XX Vector Network measurement system maintenance manual,” P/N 10410-00205 Rev:H, Anritsu, 2004.
    29. “Operation manual Vector Network Analyzers R&S ZVA8/ ZVA24/ ZVA40,” P/N: 1145. 1084. 12-10, Rohde & Schwarz, 2006

    QR CODE
    :::