| 研究生: |
謝明峯 Ming Hsieh |
|---|---|
| 論文名稱: |
閥製品加速壽命試驗法數學模式之研究 |
| 指導教授: |
黃俊仁
Jiun-ren Hwang |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 機械工程學系 Department of Mechanical Engineering |
| 畢業學年度: | 88 |
| 語文別: | 中文 |
| 論文頁數: | 118 |
| 中文關鍵詞: | 加速壽命試驗 、壓力平衡閥 、韋伯機率紙 |
| 外文關鍵詞: | Accelerated Life Testing, Pressure Balance Valve, Weibull Probability Paper |
| 相關次數: | 點閱:11 下載:0 |
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在本文中探討冷熱水入口溫度、壓力、動作頻率等條件對於壓力平衡閥失效(漏水)壽命之影響,並將實驗結果以各種加速壽命理論的數學模式進行回歸分析,找出最適用的數學理論模式及在該模式中的相關係數,再經由該數學模式反推其他加速壽命測試條件,進行實驗驗證。
本研究重要成果為:
1. 各操作參數中以工作壓力(52 ~ 82psi)之平均加速率最高,為4.25, 而工作溫度(63 ~ 83℃)之平均加速率為1.94,關於此兩參數之加速壽命試驗數學模式,較佳者為Bazovsky模式及Generalized Eyring模式,而Combination模式稍差。由正常工作壓力(52psi)及工作溫度(63℃)經由此三種數學模式所得中位壽命值與實驗值之誤差皆在2%以下。
2. 頻率(20 ~ 40cpm)加速法之平均加速率為2.82,但其效果隨著工作壓力或工作溫度之提高而明顯下降,在使用上應特別注意。
3. 判定壓力(52 ~ 82psi)加速法之平均加速率為1.19,其加速效果隨著工作溫度之提高而增加,但不同工作壓力下之判定壓力加速效果並無明顯改變。
4. 由破損面的觀察可知壓力平衡閥的失效機構為橡膠膜片與開關轉軸間的磨損所造成,此與壽命韋伯分佈參數β值在1 ~ 3.3之間,所代表的磨耗破壞機構是相符的。此外,由粗糙度Rmax來比較,可發現Rmax與循環數有關,而與造成壓力平衡閥之失效無關。
5. 本試驗正常壽命試驗條件為在52psi,63℃,20cpm及判定壓力52psi下操作10,0000循環數。當操作條件改為82psi,83℃,40cpm及判定壓力82psi時,僅需5918循環數,其加速率達18.2,高於本研究原設定目標值10。
1.ANSI/ASSE-1016. “Performance Requirements for Individual Thermostatic Pressure Balancing and Combination Pressure Balancing Thermostatic Control Valves Individual Fixtures.” Mar. 1997.
2.ANSI/ASTM A112.18.1M-1996.
2.ANSI/ASTM A112.18.1M-1996.
4.Alan J. Watkins, “On the Analysis of Accelerated Life-Testing Experiments,” IEEE Transactions on Reliability, Vol.40, No.1, Apr. 1991, pp98-101.
5.D. Kececioglu, ”Reliability & Life Testing Handbook,” PTR Prentice-Hall, Inc., Vol.2, New Jersey, 1994.
6.G. B. Yang, “Optimum Constant-Sress Accelerated Life-Test Plans,” IEEE Transactions on Reliability, Vol.43, No.4, 1994, Dec, pp575-581.
7.G. C. Stone and H. Rosen, “Some Graphical Techniques for Estimating Weibull Confidence Limits,” IEEE Transactions on Reliability, Vol. 33, part 5, Dec. 1984, pp362-369.
7.G. C. Stone and H. Rosen, “Some Graphical Techniques for Estimating Weibull Confidence Limits,” IEEE Transactions on Reliability, Vol. 33, part 5, Dec. 1984, pp362-369.
7.G. C. Stone and H. Rosen, “Some Graphical Techniques for Estimating Weibull Confidence Limits,” IEEE Transactions on Reliability, Vol. 33, part 5, Dec. 1984, pp362-369.
10.H. Caruso, and A. Dasgupta, “Fundamental Overview of Accelerated Testing Analytical Models,” Journal of the IEST, Vol.41, No.1, Jan-Feb 1998, pp.16-20.
11.H.Strelec, “Model Accelerated Life Testing,” Structural Safety, Vol.12, No.2, Jun. 1993, pp129-136.
12.J. W. Park, and B. J. Yum, “Optimal Design of Accelerated Life Tests with Two Stresses,” Naval Research Logistics, Vol.43, No.6, Sep, 1996, pp.863-884.
12.J. W. Park, and B. J. Yum, “Optimal Design of Accelerated Life Tests with Two Stresses,” Naval Research Logistics, Vol.43, No.6, Sep, 1996, pp.863-884.
14.J. Jacquelin, “Generalization of the method of Maximum Likelihood,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 28 No.1, 1993, pp65-72.
15.J.S. White, “The Moments of Log-Weibull Order Statistics,” Technometrics, Vol. 11 No.2, May 1969, pp.374-386.
16.J. F. Lawless, “Statistical Models and Methods for Lifetime Data,” J. Wiley & Sons, NY, 1982.
17.L. A. Escobar, and W. Q. Meeker, “Planning accelerated Life Tests with Two or More Experimental Factors,” Technometrics, Vol.37, No.4, Nov .1995, pp.411-427.
18.M. J. Luvalle, “Experiment Design and Graphical Analysis for Checking Acceleration Models,” Microelectronics and Reliability, Vol.33, No.5, Apr. 1993, pp.741-763.
18.M. J. Luvalle, “Experiment Design and Graphical Analysis for Checking Acceleration Models,” Microelectronics and Reliability, Vol.33, No.5, Apr. 1993, pp.741-763.
20.N. R. Mann, and R. E. Schafer, and N. D. Singpurwalla, “Methods for Statistical Analysis of Reliability and Life Data,” John Wiley & Sons, Inc., New York, 1974.
20.N. R. Mann, and R. E. Schafer, and N. D. Singpurwalla, “Methods for Statistical Analysis of Reliability and Life Data,” John Wiley & Sons, Inc., New York, 1974.
20.N. R. Mann, and R. E. Schafer, and N. D. Singpurwalla, “Methods for Statistical Analysis of Reliability and Life Data,” John Wiley & Sons, Inc., New York, 1974.
20.N. R. Mann, and R. E. Schafer, and N. D. Singpurwalla, “Methods for Statistical Analysis of Reliability and Life Data,” John Wiley & Sons, Inc., New York, 1974.
24.S. T. Tseng and C. H. Chyau, “Classification Rule Arising from Accelerated Life Test,” Reliability Engineering & System Safety, Vol.43, No.3, 1994, pp.247-256.
25.S. K. Sinha and B. K. Kale, “Life Testing and Reliability Estimation,” J. Wiley & Sons, NY, 1980.
26.W. Nelson, “Applied Life Data Analysis,” John Wiley & Sons, Inc., New York, 1982.
27.W. Nelson, “Accleerated Testing: Statistical Model, Test Plans, and Data Analysis,” John Wiley & Sons, Inc., New York, 1990.
28.W. Q. Meeker, L. A. Escobar, and C. J. Lu,“ Accelerated Degradation Tests: Modeling and Analysis,” Technometrics, Vol.40, No.2, May 1998, pp.89-99.
29.賴耿陽 , “產品壽命管制技術,” 復漢出版社, 中華民國88年3月。
30.陳裕城 , “機械零組件之加速耐久分析”, 國立中央大學, 碩士論文, 中華民國87年6月。
31.蕭名男 , “可靠度加速壽命測試模式之比較分析,” 國立成功大學, 碩士論文, 中華民國88年6月。
32.林來傳 , “壓力平閥基本設計概念,” 金屬工業, 32卷, 4期, 中華民國87年7月。
33.解謀東 , “加速試驗淺驗,” 機械工業雜誌, 87年元月號。
34.柯輝耀 , “加速壽命試驗技術,” 經濟部技術處, 中華民國85年5月。