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研究生： 陳俊宏
Jun-Hong Chen
論文名稱： 內建式類比數位/數位類比轉換器線性度之自我測試
BIST for ADCs/DACs Linearity Testing
指導教授： 蘇朝琴
Chauchin Su
口試委員:
學位類別： 碩士
Master
系所名稱： 資訊電機學院 - 電機工程學系
Department of Electrical Engineering
畢業學年度： 89
語文別： 中文
論文頁數： 42
中文關鍵詞： 類比數位轉換器 、數位類比轉換器 、非線性度 、內建式自我測式 、混合信號測試
外文關鍵詞： ADC, DAC, BIST, nonlinearity, testing, mixed-signal testing
相關次數： 點閱：14  下載：0 
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    • 1. Introduction 1.1 Motivation 1.2 ADC/DAC Testing Methodologies Overview 1.3 Thesis Organization 2. Survey of ADC/DAC Testing Methodologies 2.1 Introduction 2.2 ADC Testing Methodologies 2.2.1 Static Test Method 2.2.2 Dynamic Test Method: Histogram Testing 2.2.3 Dynamic Test Method: FFT Testing 2.3 DAC Testing Methodologies 2.4 BIST for DAC-ADC Pair 3. Proposed Methodology for on-chip ADCs/DACs Testing 3.1 Introduction 3.2 BIST Structure for On-Chip ADCs/DACs Testing 3.3 Testing Strategy and Consideration 3.4 Simulation Results 3.4.1 Phase 1: Deriving the output codes of the reference voltages 3.4.2 Phase 2: Time constant determination and ADC INL 3.4.3 Phase 3: Deriving integral nonlinearity of the DAC 4. Hareware Testing Results 4.1 Introduction 4.2 Test Environment 4.3 Test Results 4.3.1 Phase 1 test results 4.3.2 Phase 2 test results 4.3.3 Phase 3 test result 5. Conclusions

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