| 研究生: |
蔡良盛 Lian-She Tsai |
|---|---|
| 論文名稱: |
基於IEEE 1057之類比數位轉換器量測技術 IEEE 1057 Based ADC Test Methodology |
| 指導教授: |
蘇朝琴
Chauchin Su |
| 口試委員: | |
| 學位類別: |
碩士 Master |
| 系所名稱: |
資訊電機學院 - 電機工程學系 Department of Electrical Engineering |
| 畢業學年度: | 88 |
| 語文別: | 中文 |
| 論文頁數: | 51 |
| 中文關鍵詞: | 混合信號量測 、類比數位轉換器 、類比數位轉換器量測技術 |
| 外文關鍵詞: | Mix signal testing, analog to digital, analog to digital test methodology |
| 相關次數: | 點閱:10 下載:0 |
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近年來由於混合信號的量測的需求據增,再加上單晶系統(system on chip:SOC)技術快速發展,使得晶片的容量變大,因而使得測試相對變的較複雜,所需測試時間亦較長,因此我們便根據IEEE 1057的標準,提出各種不同的量測方法,使傳統的大型混合信號測試機台,可以有一個很好的量測技術方法可參考。
為了使量測不因取樣的關係,產生不應該有的錯誤,因此我們先提出取樣點的頻率與週期的決選方法,為了使IEEE 1057(IEEE Standard for Digitizing Waveform Recorders)的各種量測方法,能夠看出對類比數位轉換器(analog to digital converter:ADC)的明顯差異,因此我們提出了非理想類比數位轉換器的錯誤模型,接著利用建立起來的非理想類比數位轉換器模型,使用IEEE 1057各種不同方法,針對我們數位類比轉換器量測比較其非理想特性,與雜訊對我們實際量測的差異,最後為了方便使用者能夠很方便的更改類比數位轉換器的各種規格,進行觀察各種測試方法所得到的不同結果,因此我們以MATLAB建立起一個使用者介面,使我們能夠很輕易更改不同的類比數位轉換器規格,並迅速的顯示各種不同的量測結果。
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